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arXiv 2102.04608quant-ph
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用序贯投影测量证明量子系统的维数

Certifying dimension of quantum systems by sequential projective measurements

Adel Sohbi, Damian Markham, Jaewan Kim, Marco Túlio Quintino

摘要:

这项工作分析了量子系统中产生的相关性进行连续的投影测量,以证明该系统的问题有一个量子尺寸大于一些$d$。我们改进了以前已知的方法,并表明,尺寸大于2可以在比以前提出的方案要简单得多的情况下进行认证,并首次在这个顺序投影的情况下,我们证明量子系统的尺寸严格大于3。我们还进行了系统的数值分析方面的鲁棒性,并得出结论,执行随机的纯quutrit状态的随机投影测量允许一个强大的认证的量子尺寸具有很高的概率。

英文摘要:

This work analyzes correlations arising from quantum systems subject to sequential projective measurements to certify that the system in question has a quantum dimension greater than some $d$. We refine previous known methods and show that dimension greater than two can be certified in scenarios which are considerably simpler than the ones presented before and, for the first time in this sequential projective scenario, we certify quantum systems with dimension strictly greater than three. We also perform a systematic numerical analysis in terms of robustness and conclude that performing random projective measurements on random pure qutrit states allows a robust certification of quantum dimensions with very high probability.

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