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arXiv 2012.14632cs.DScs.ITcs.LGmath.IT

Testing Product Distributions: A Closer Look

National University of Singapore(新加坡国立大学);Cornell University(康奈尔大学);University of Nebraska-Lincoln(内布拉斯加大学林肯分校)

Arnab Bhattacharyya, Sutanu Gayen, Saravanan Kandasamy, N. V. Vinodchandran

英文摘要:

We study the problems of identity and closeness testing of $n$-dimensional product distributions. Prior works by Canonne, Diakonikolas, Kane and Stewart (COLT 2017) and Daskalakis and Pan (COLT 2017) have established tight sample complexity bounds for non-tolerant testing over a binary alphabet: given two product distributions $P$ and $Q$ over a binary alphabet, distinguish between the cases $P = Q$ and $d_{\mathrm{TV}}(P, Q) > ε$. We build on this prior work to give a more comprehensive map of the complexity of testing of product distributions by investigating tolerant testing with respect to several natural distance measures and over an arbitrary alphabet. Our study gives a fine-grained understanding of how the sample complexity of tolerant testing varies with the distance measures for product distributions. In addition, we also extend one of our upper bounds on product distributions to bounded-degree Bayes nets.

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