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arXiv 2012.08854cs.LGstat.ML

Using noise resilience for ranking generalization of deep neural networks

Indian Institute of Technology Madras(印度理工学院马德拉斯分校)

Depen Morwani, Rahul Vashisht, Harish G. Ramaswamy

英文摘要:

Recent papers have shown that sufficiently overparameterized neural networks can perfectly fit even random labels. Thus, it is crucial to understand the underlying reason behind the generalization performance of a network on real-world data. In this work, we propose several measures to predict the generalization error of a network given the training data and its parameters. Using one of these measures, based on noise resilience of the network, we secured 5th position in the predicting generalization in deep learning (PGDL) competition at NeurIPS 2020.

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