arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2011.08785cs.CV

PaDiM: a Patch Distribution Modeling Framework for Anomaly Detection and Localization

Université Paris-Saclay(巴黎-萨克雷大学);CEA(法国原子能和替代能源委员会);List(List实验室)

Thomas Defard, Aleksandr Setkov, Angelique Loesch, Romaric Audigier

英文摘要:

We present a new framework for Patch Distribution Modeling, PaDiM, to concurrently detect and localize anomalies in images in a one-class learning setting. PaDiM makes use of a pretrained convolutional neural network (CNN) for patch embedding, and of multivariate Gaussian distributions to get a probabilistic representation of the normal class. It also exploits correlations between the different semantic levels of CNN to better localize anomalies. PaDiM outperforms current state-of-the-art approaches for both anomaly detection and localization on the MVTec AD and STC datasets. To match real-world visual industrial inspection, we extend the evaluation protocol to assess performance of anomaly localization algorithms on non-aligned dataset. The state-of-the-art performance and low complexity of PaDiM make it a good candidate for many industrial applications.

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