Electron tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. Unfortunately, the acquisition of conventional electron tomography tilt series can easily take up one hour or more, depending on the complexity of the experiment. Using electron tomography, it is therefore far from straightforward to obtain statistically meaningful 3D data, to investigate samples that do not withstand long acquisition, or to perform in situ 3D characterization using this technique. Various acquisition strategies have been proposed to accelerate the tomographic acquisition, and reduce the required electron dose. These methods include tilting the holder continuously while acquiring a projection movie and a hybrid, incremental, methodology which combines the benefits of the conventional and continuous technique. In this paper, the different acquisition strategies will be experimentally compared in terms of speed, resolution and electron dose, based on experimental tilt series acquired for various metallic nanoparticles.
Nucleation at the GST--oxide interface and beam-driven ordering in amorphous Ge--Sb--Te: HAADF, EDS and electron pair distribution functions across a 4D-STEM dose series
Estimation of mass thickness response of embedded aggregated silica nanospheres from high angle annular dark-field scanning transmission electron micrographs
A Deep Learning Approach for Semantic Segmentation of Unbalanced Data in Electron Tomography of Catalytic Materials
Center for the Accelerated Maturation of Materials（材料加速成熟中心）；Department of Materials Science and Engineering（材料科学与工程系）；The Ohio State University（俄亥俄州立大学）；Institute for Integrated Catalysis（综合催化研究所）；Pacific Northwest National Laboratory（太平洋西北国家实验室）
Low-Dose 3D Bonding Mapping Through "Soft" Core-Loss EELS Tomography and Unsupervised Deep Learning
Université de Lille（里尔大学）；Instituto de Nanociencia y Materiales de Aragon (INMA), CSIC-U. de Zaragoza（阿拉贡纳米科学与材料研究所（INMA），萨拉戈萨大学/西班牙国家研究委员会）；Univ. Grenoble Alpes, CEA, Leti（格勒诺布尔阿尔卑斯大学，法国原子能和替代能源委员会，技术研究所）；Centre d’Elaboration de Matériaux et d’Etudes Structurales (CEMES), University of Toulouse and CNRS（材料与结构研究制备中心（CEMES），图卢兹大学及法国国家科学研究中心）；Univ. Lille, FR 2638-IMEC-Institut Michel-Eugène Chevreul（里尔大学，FR 2638-IMEC-米歇尔·欧仁·谢弗勒尔研究所）；CEA, Joliot, NeuroSpin（法国原子能和替代能源委员会，若利奥神经影像中心）；Inria, MIND, Université Paris-Saclay（法国国家信息与自动化研究所，MIND团队，巴黎萨克雷大学）；Department of Inorganic and Organic Chemistry, Inorganic Chemistry Section, University of Barcelona（巴塞罗那大学无机与有机化学系，无机化学教研室）；Institute of Nanoscience and Nanotechnology (IN2UB), Universitat de Barcelona（巴塞罗那大学纳米科学与纳米技术研究所（IN2UB））；Department of Materials Science and Engineering, Ångström Laboratory, Uppsala University（乌普萨拉大学昂斯特实验室材料科学与工程系）；LENS-MIND, Departament d'Enginyeria Electrònica i Biomèdica, Universitat de Barcelona（巴塞罗那大学电子与生物医学工程系，LENS-MIND）；Laboratorio de Microscopias Avanzadas, Universidad de Zaragoza（萨拉戈萨大学先进显微术实验室）
Near-Isotropic Sub-Ångstrom 3D Resolution Phase Contrast Imaging Achieved by End-to-End Ptychographic Electron Tomography
Institute of Micro- and Nanostructure Research (IMN)（微纳米结构研究所）；Center for Nanoanalysis and Electron Microscopy (CENEM)（纳米分析与电子显微镜中心）；Friedrich Alexander-Universität Erlangen-Nürnberg（埃尔朗根-纽伦堡弗里德里希·亚历山大大学）
A 4D-STEM Tomographic Framework Assisted by Object Tracking for Nanoparticle Structure Determination
EMAT, Department of Physics, University of Antwerp（安特卫普大学物理系）；CRISMAT, Normandie Université, ENSICAEN, UNICAEN, CNRS UMR 6508（诺曼底大学、ENSICAEN、UNICAEN、法国国家科学研究中心UMR 6508）；Department of Chemistry, KU Leuven（荷语鲁汶大学化学系）
Crystallographic Challenges in Microscopy of Multidomain Spinel Materials
Department of Materials Science and Engineering, University of California, Berkeley（加州大学伯克利分校材料科学与工程系）；Materials Sciences Division, Lawrence Berkeley National Laboratory（劳伦斯伯克利国家实验室材料科学部）；Department of Materials Science and Engineering, Stanford University（斯坦福大学材料科学与工程系）
