3 $d$-5 $d$基Sr $_2$ FeIrO $_6$薄膜的结构、磁性和介电性能
Structural, magnetic and dielectric properties in 3$d$-5$d$ based Sr$_2$FeIrO$_6$ thin films
摘要:
研究了脉冲激光沉积技术制备的3-$d$-5-$d$基双钙钛矿结构Sr-$_2$-FeIrO-$_6$薄膜的结构、磁性和介电性能。为了理解应变的影响,外延膜以不同的厚度以及在不同的衬底上生长,SrTiO $_3$(100)和LaAlO $_3$(100)。具有最高厚度的膜被发现更松弛。原子力显微镜图像表明,所有的薄膜都是良好的质量,其中晶粒尺寸随薄膜厚度的增加而增加。X射线吸收光谱测量表明本发明膜中的Ir $^{5+}$电荷状态,同时提供Fe/Ir-$d$和O-$p$轨道之间的杂化的详细图片。虽然薄膜的反铁磁转变温度向高温方向移动,但薄膜中的体反铁磁转变仍然存在。介电常数($ε_r$)和损耗($\tanδ$)都在体相SrPDMATHABMN FeIrOPDMATHABMO的磁有序温度附近发生变化,表明介电和磁行为之间存在密切关系。在本发明的薄膜中,发现在整个频率范围内直到低温都有麦克斯韦-瓦格纳型弛豫。在改变衬底时,即,LaAlO $_3$(100)、$ε_r(T)$和($\tanδ(T)$)显示出几乎相似的行为,但$ε_r$显示出更高的值,这是由于来自晶格参数的高失配的增加的应变。
英文摘要:
The structural, magnetic and dielectric properties have been investigated in 3$d$-5$d$ based double perovskite Sr$_2$FeIrO$_6$ thin films deposited by pulse laser deposition technique. To understand the effect of strain, epitaxial films are grown with varying thickness as well as on different substrates i.e., SrTiO$_3$ (100) and LaAlO$_3$ (100). The films with highest thickness are found to be more relaxed. Atomic force microscope images indicate all films are of good quality where grain sizes increase with increase in film thickness. X-ray absorption spectroscopy measurements indicate a Ir$^{5+}$ charge state in present films while providing a detailed picture of hybridization between Fe/Ir-$d$ and O-$p$ orbitals. The bulk antiferromagnetic transition is retained in films though the transition temperature shifts to higher temperature. Both dielectric constant ($ε_r$) and loss ($\tanδ$) show change around the magnetic ordering temperatures of bulk Sr$_2$FeIrO$_6$ indicating a close relation between dielectric and magnetic behaviors. A Maxwell-Wagner type relaxation is found to follow over whole frequency range down to low temperature in present film. On changing the substrate i.e., LaAlO$_3$ (100), the $ε_r(T)$ and ($\tanδ(T)$) show almost similar behavior but $ε_r$ shows a higher value which is due to an increased strain coming from high mismatch of lattice parameters.
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