arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2008.11046cond-mat.mtrl-sci
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数据质量和模型参数对X射线衍射数据Rietveld定量相分析的影响

The effect of data quality and model parameters on the quantitative phase analysis of X-ray diffraction data by the Rietveld method

Matthew R. Rowles

摘要:

X射线粉末衍射数据的质量以及可细化参数的数量和类型已经通过Rietveld方法使用从来自QPA循环的两个样品收集的数据[Madsen等人,J. Appl. Cryst.(2001),34,409-26]检验了它们对定量相分析(QPA)的影响。根据对这些最佳情况假设样本的分析,提出了一系列关于数据收集和分析最低标准的建议。希望这些将有助于新的QPA-by-Rietveld用户进行分析。

英文摘要:

The quality of X-ray powder diffraction data and the number and type of refinable parameters have been examined with respect to their effect on quantitative phase analysis (QPA) by the Rietveld method using data collected from two samples from the QPA round robin [Madsen et al. J. Appl. Cryst. (2001), 34, 409-26]. From these analyses of these best-case-scenario specimens, a series of recommendations for minimum standards of data collection and analysis are proposed. It is hoped that these will aid new QPA-by-Rietveld users in their analyses.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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