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arXiv 2008.09765physics.ins-dethep-ex
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用宇宙μ子测量MicroBooNE LArTPC中的空间电荷效应

Measurement of Space Charge Effects in the MicroBooNE LArTPC Using Cosmic Muons

MicroBooNE collaboration, P. Abratenko, M. Alrashed, R. An, J. Anthony, J. Asaadi, A. Ashkenazi, S. Balasubramanian, B. Baller, C. Barnes, G. Barr, V. Basque, L… 展开作者

MicroBooNE collaboration, P. Abratenko, M. Alrashed, R. An, J. Anthony, J. Asaadi, A. Ashkenazi, S. Balasubramanian, B. Baller, C. Barnes, G. Barr, V. Basque, L. Bathe-Peters, O. Benevides Rodrigues, S. Berkman, A. Bhanderi, A. Bhat, M. Bishai, A. Blake, T. Bolton, L. Camilleri, D. Caratelli, I. Caro Terrazas, R. Castillo Fernandez, F. Cavanna, G. Cerati, Y. Chen, E. Church, D. Cianci, E. O. Cohen, J. M. Conrad, M. Convery, L. Cooper-Troendle, J. I. Crespo-Anadon, M. Del Tutto, D. Devitt, R. Diurba, L. Domine, R. Dorrill, K. Duffy, S. Dytman, B. Eberly, A. Ereditato, L. Escudero Sanchez, J. J. Evans, G. A. Fiorentini Aguirre, R. S. Fitzpatrick, B. T. Fleming, N. Foppiani, D. Franco, A. P. Furmanski, D. Garcia-Gamez, S. Gardiner, S. Gollapinni, O. Goodwin, E. Gramellini, P. Green, H. Greenlee, L. Gu, W. Gu, R. Guenette, P. Guzowski, E. Hall, P. Hamilton, O. Hen, G. A. Horton-Smith, A. Hourlier, E. C. Huang, R. Itay, C. James, J. Jan de Vries, X. Ji, L. Jiang, J. H. Jo, R. A. Johnson, Y. J. Jwa, N. Kamp, G. Karagiorgi, W. Ketchum, B. Kirby, M. Kirby, T. Kobilarcik, I. Kreslo, R. LaZur, I. Lepetic, K. Li, Y. Li, B. R. Littlejohn, D. Lorca, W. C. Louis, X. Luo, A. Marchionni, S. Marcocci, C. Mariani, D. Marsden, J. Marshall, J. Martin-Albo, D. A. Martinez Caicedo, K. Mason, A. Mastbaum, N. McConkey, V. Meddage, T. Mettler, K. Miller, J. Mills, K. Mistry, T. Mohayai, A. Mogan, J. Moon, M. Mooney, A. F. Moor, C. D. Moore, J. Mousseau, M. Murphy, D. Naples, A. Navrer-Agasson, R. K. Neely, P. Nienaber, J. Nowak, O. Palamara, V. Paolone, A. Papadopoulou, V. Papavassiliou, S. F. Pate, A. Paudel, Z. Pavlovic, E. Piasetzky, I. Ponce-Pinto, D. Porzio, S. Prince, X. Qian, J. L. Raaf, V. Radeka, A. Rafique, M. Reggiani-Guzzo, L. Ren, L. Rochester, J. Rodriguez Rondon, H. E. Rogers, M. Rosenberg, M. Ross-Lonergan, B. Russell, G. Scanavini, D. W. Schmitz, A. Schukraft, M. H. Shaevitz, R. Sharankova, J. Sinclair, A. Smith, E. L. Snider, M. Soderberg, S. Soldner-Rembold, S. R. Soleti, P. Spentzouris, J. Spitz, M. Stancari, J. St. John, T. Strauss, K. Sutton, S. Sword-Fehlberg, A. M. Szelc, N. Tagg, W. Tang, K. Terao, R. T. Thornton, C. Thorpe, M. Toups, Y. -T. Tsai, S. Tufanli, M. A. Uchida, T. Usher, W. Van De Pontseele, R. G. Van de Water, B. Viren, M. Weber, H. Wei, Z. Williams, S. Wolbers, T. Wongjirad, M. Wospakrik, W. Wu, T. Yang, G. Yarbrough, L. E. Yates, G. P. Zeller, J. Zennamo, C. Zhang

摘要:

大型液态氩时间投影室(LArTPC),特别是在表面附近工作的那些,容易受到空间电荷效应的影响。在LArTPC的背景下,空间电荷效应是主要由于来自宇宙射线的电离而在检测器中缓慢移动的正离子的积累,导致检测器内的电场的失真。这种效应导致LArTPC检测器中信号电离电子的重建位置的位移(“空间失真”),以及导致整个TPC体积中电离所经历的电子-离子复合量的变化。我们提出的技术,可用于测量和校正空间电荷效应在大型LArTPC利用宇宙μ子,包括使用轨道对明确地钉在三维空间失真。使用蒙特卡罗模拟和MicroBooNE数据,利用紫外激光系统作为一种手段来估计与校准方法相关的系统偏差,这些校准技术的性能进行了研究。

英文摘要:

Large liquid argon time projection chambers (LArTPCs), especially those operating near the surface, are susceptible to space charge effects. In the context of LArTPCs, the space charge effect is the build-up of slow-moving positive ions in the detector primarily due to ionization from cosmic rays, leading to a distortion of the electric field within the detector. This effect leads to a displacement in the reconstructed position of signal ionization electrons in LArTPC detectors ("spatial distortions"), as well as to variations in the amount of electron-ion recombination experienced by ionization throughout the volume of the TPC. We present techniques that can be used to measure and correct for space charge effects in large LArTPCs by making use of cosmic muons, including the use of track pairs to unambiguously pin down spatial distortions in three dimensions. The performance of these calibration techniques are studied using both Monte Carlo simulation and MicroBooNE data, utilizing a UV laser system as a means to estimate the systematic bias associated with the calibration methodology.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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