非退偏双通旋光法的误差分析
Tolerance analysis of non-depolarizing double-pass polarimetry
摘要：
双通偏振法测量样品在极角和所有方位角范围内的偏振特性。在这里，我们提出了一个公差分析的所有光学元件的校准和测量过程中预测的灵敏度的双程偏振计。校准过程中描述了一个米勒矩阵的特征值校准方法（ECM）的基础上。我们的数值结果从校准和测量中的Mueller矩阵描述与公差限制的系统和随机噪声规格的商用硬件组件是在良好的协议与以前的实验观察。此外，利用方向Zernike多项式（OZP）对Jones矩阵进行了扩展，类似于Zernike多项式波前展开，展开了非退偏样品偏振特性的光瞳分布。使用范围高达25 $^{\circ}$的极角，我们预测的灵敏度为0.5%的双衰减和0.3 $^{\circ}$延迟使用相应的OZP系数的均方根（RMS）作为测量的错误。该数值工具提供了一种通过误差预算和用具有更高精度的元件替换敏感元件来进一步提高偏振计灵敏度的方法。
英文摘要：
Double-pass polarimetry measures the polarization properties of a sample over a range of polar angles and all azimuths. Here, we present a tolerance analysis of all the optical elements in both the calibration and measurement procedures to predict the sensitivities of the double-pass polarimeter. The calibration procedure is described by a Mueller matrix based on the eigenvalue calibration method (ECM). Our numerical results from the calibration and measurement in the Mueller matrix description with tolerances limited by systematic and stochastic noise from specifications of commercially available hardware components are in good agreement with previous experimental observations. Furthermore, by using the orientation Zernike polynomials (OZP) which are an extension of the Jones matrix formalism, similar to the Zernike polynomials wavefront expansion, the pupil distribution of the polarization properties of non-depolarizing samples under test are expanded. Using polar angles ranging up to 25$^{\circ}$, we predict a sensitivity of 0.5% for diattenuation and 0.3$^{\circ}$ for retardance using the root mean square (RMS) of the corresponding OZP coefficients as a measure of the error. This numerical tool provides an approach for further improving the sensitivities of polarimeters via error budgeting and replacing sensitive components with those having better precision.
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