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arXiv 2008.04680cond-mat.mtrl-sci
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使用粘附增强栅格实现CrBr$_{3}$的原子分辨率成像

Atomic Resolution Imaging of CrBr$_{3}$ using Adhesion-Enhanced Grids

Matthew J. Hamer, David G. Hopkinson, Nick Clark, Mingwei Zhou, Wendong Wang, Yichao Zou, Daniel J. Kelly, Thomas H. Bointon, Sarah J. Haigh, Roman V. Gorbachev

AI总结:

针对横向小尺寸二维晶体洁净悬浮样品制备难的问题,提出将二维堆叠体干法转印到粘附增强栅格的可规模化方案,实现100%良率的自支撑样品制备,并完成气敏磁性材料CrBr₃的缺陷原子分辨率成像。

摘要:

二维晶体及其异质结的悬浮样品是透射电子显微镜(TEM)、光透射实验和纳米力学测试等一系列研究的必需材料。然而,由于难以制备所需的洁净悬浮样品,对横向尺寸较小的二维晶体样品(包括扭曲双层结构和气敏材料)的性质研究一直受到阻碍。本文提出了一种可规模化的解决方案:通过将原子级厚度的二维堆叠体干法转印到专门开发的粘附增强支撑栅格上,能够以100%的良率制备出洁净的自支撑样品。利用这一新能力,我们展示了原子级厚度CrBr₃(一种在环境条件下会降解的新型磁性材料)中缺陷结构的原子分辨率成像。

英文摘要:

Suspended specimens of 2D crystals and their heterostructures are required for a range of studies including transmission electron microscopy (TEM), optical transmission experiments and nanomechanical testing. However, investigating the properties of laterally small 2D crystal specimens, including twisted bilayers and air sensitive materials, has been held back by the difficulty of fabricating the necessary clean suspended samples. Here we present a scalable solution which allows clean free-standing specimens to be realized with 100% yield by dry-stamping atomically thin 2D stacks onto a specially developed adhesion-enhanced support grid. Using this new capability, we demonstrate atomic resolution imaging of defect structures in atomically thin CrBr3, a novel magnetic material which degrades in ambient conditions.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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