老龄化可重构技术综述
A Survey of Aging Monitors and Reconfiguration Techniques
摘要：
CMOS技术的缩放使得老化效应成为集成电路设计和制造的重要关注点。老化会缩短电路的使用寿命，使其更早失效。这种退化会影响电路的所有部分，并影响其性能和可靠性。当代文献显示了使用硬件和软件监控机制和重新配置技术来监控和减轻老化的解决方案。本次最新技术水平审查的目的是确定现有的老化监测和重新配置解决方案。本调查评估了老化研究，重点是2012年至2019年，并提出了监视器和重新配置技术的分类。结果表明，用于老化检测的最常见的监视器类型是监视定时误差，用于处理老化的最常见的重新配置技术是电压缩放。此外，大多数文献贡献都是在数字领域，使用硬件解决方案来监控电路中的老化。在模拟领域的文献贡献很少，这是数字领域的调查范围。通过仔细研究这些解决方案，本调查为进一步研究和开发老化监测器和重新配置技术指明了方向
英文摘要：
CMOS technology scaling makes aging effects an important concern for the design and fabrication of integrated circuits. Aging deterioration reduces the useful life of a circuit, making it fail earlier. This deterioration can affect all portions of a circuit and impacts its performance and reliability. Contemporary literature shows solutions to monitor and mitigate aging using hardware and software monitoring mechanisms and reconfiguration techniques. The goal of this review of the state-of-the-art is to identify existing monitoring and reconfiguration solutions for aging. This survey evaluates the aging research, focusing the years from 2012 to 2019, and proposes a classification for monitors and reconfiguration techniques. Results show that the most common monitor type used for aging detection is to monitor timing errors, and the most common reconfiguration technique used to deal with aging is voltage scaling. Furthermore, most of the literature contributions are in the digital field, using hardware solutions for monitoring aging in circuits. There are few literature contributions in the analog area, being the scope of this survey in the digital domain. By scrutinizing these solutions, this survey points directions for further research and development of aging monitors and reconfiguration techniques
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
