SPOT-IL正电子束结构及其用于钛薄膜的多普勒展宽测量
The SPOT-IL Positron Beam Construction and Its Use for Doppler Broadening Measurement of Titanium Thin Films
摘要：
本文报道了在希伯来大学建立的慢正电子束的建造和首次运行。该束遵循传统的设计，使用22 Na源，钨减速器和配备有加载锁定系统的靶室，以便于样品插入。束能量在0.03 keV和30 keV之间变化。探测系统由两个高纯度锗探测器组成，彼此面对，允许低背景多普勒展宽（DB）测量。事件读出是使用一个国家的最先进的紧凑型桌面系统。靶池的设计允许DB和样品电导率的组合测量，并可在未来灵活添加更多检测选项。该束已成功地用于钛（Ti）薄膜的测试。在不同能量（2 keV - 25 keV）下测量了两种1.2 μm的Ti膜--制备态和退火后的Ti膜，结果与以前的测量结果一致。
英文摘要：
The construction and first operation of the slow positron beam built at the Hebrew University is reported here. The beam follows a traditional design, using a 22Na source, a Tungsten moderator, and a target cell equipped with a load-lock system for easy sample insertion. The beam energy varies between 0.03 keV and 30 keV. The detection system consists of two high purity Germanium detectors, facing each other, allowing low-background Doppler-Broadening (DB) measurements. Event readout is done using a state-of-the-art compact desktop system. The target cell is designed to allow a combined measurement of DB and sample conductivity, with the flexibility to add more detection options in the future. The beam has been successfully tested by using it to charecterize Titanium (Ti) films. Two 1.2 μm Ti films -- as produced, and after annealing, were measured at various energies (2 keV - 25 keV), and the results show consistent behavior with previous measurements.
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