快速重复电压加速绝缘老化：挑战与未来研究需求
Accelerated Insulation Aging Due to Fast, Repetitive Voltages: A Review Identifying Challenges and Future Research Needs
摘要：
虽然已经研究了使用电力电子转换对不同设备中使用的绝缘系统的不利影响，但它们限于低转换速率和重复性。这些结果不能用于下一代基于宽带隙（WBG）的转换系统，其目标是快速（转换速率高达100 kV/us）并且以高达500 kHz的高开关频率工作。频率和转换速率是电压脉冲的两个最重要的因素，影响暴露于这种电压脉冲的绝缘系统的劣化水平。本文回顾了受益于具有上述压摆率和开关频率值的基于WBG的转换系统时有关绝缘退化的挑战，并确定了技术差距和未来的研究需求。本文提供了一个框架，为未来的研究，在快速，重复的电压脉冲源于基于WBG的转换系统的系统的绝缘和电气绝缘设计。
英文摘要：
Although the adverse effects of using power electronic conversion on the insulation systems used in different apparatuses have been investigated, they are limited to low slew rates and repetitions. These results cannot be used for next-generation wide bandgap (WBG) based conversion systems targeted to be fast (with a slew rate up to 100 kV/us) and operate at a high switching frequency up to 500 kHz. Frequency and slew rate are two of the most important factors of a voltage pulse, influencing the level of degradation of the insulation systems that are exposed to such voltage pulses. The paper reviews challenges concerning insulation degradation when benefitting from WBG-based conversion systems with the mentioned slew rate and switching frequency values and identifies technical gaps and future research needs. The paper provides a framework for future research in dielectrics and electrical insulation design for systems under fast, repetitive voltage pluses originated by WBG-based conversion systems.
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