用托卡马克等离子体K谱验证类氦和类锂离子的原子数据
Verification of atomic data for He- and Li-like ions employing K-spectra from the tokamak plasma
摘要：
在TEXTOR托卡马克装置上记录了高光谱、空间和时间分辨率的高电荷氦和锂类氩离子的X射线发射K谱，并用于发展一种自洽方法（SCA），以获得有关等离子体参数的信息，并对光谱解释所需的两种原子数据及其计算方法进行验证（准确性估计）。该方法是基于解决这些光谱的光谱逆问题的半经验的“光谱模型”（SM）的框架内，通过两个互补的反演方法。SCA是合理的比较和分析的基础上计算和校正的原子数据的测量和合成光谱。分析和验证了三组不同的类氦和类锂氩离子的原子数据。SCA允许我们验证计算原子数据的方法，其精度在5- 10%之间。用修正后的原子数据计算的光谱与等离子体条件下的测量光谱在10%的实验精度范围内符合得很好。修正后的原子数据使得能够对等离子体参数进行准确的诊断：等离子体温度和托卡马克等离子体中的相对离子丰度。该方法还提供了一种测量等离子体核心温度的方法，其测量精度在5%以内，与基于电子回旋辐射的诊断技术相一致。光谱和杂质输运模型的应用得到的相对离子丰度是在实验误差范围内一致。结果表明，托卡马克等离子体X射线能谱是高精度原子数据验证和精确等离子体诊断的有效工具。
英文摘要：
X-ray emission K-spectra of highly charged He- and Li-like argon ions recorded with high spectral, spatial, and temporal resolution at the TEXTOR tokamak were employed to develop a self-consistent approach (SCA) for deriving information on plasma parameters and the verification (estimation of accuracy) of both atomic data, needed for spectra interpretation, and methods of their calculation. The approach is based on solving the spectral inverse problem for these spectra in the framework of the semi-empirical ``spectroscopic model'' (SM) by means of two complimentary inversion methods. The SCA was justified by comparing and analyzing measured and synthetic spectra on the basis of the calculated and corrected atomic data. The three different sets of atomic data for He- and Li-like argon ions were analyzed and verified. The SCA allowed us to verify the methods for calculating the atomic data with an accuracy within of 5--10\%. The spectra calculated with corrected atomic data are in agreement with the spectra measured in the wide range of plasma conditions within the experimental accuracy of 10\%. Corrected atomic data made it possible to perform an accurate diagnostics of plasma parameters: plasma temperatures and relative ion abundances in the tokamak plasma. This procedure provided also a method for determining the temperature of the plasma core with high accuracy within 5\% in a good agreement with the diagnostics technique based on the electron cyclotron emission. The relative ion abundances obtained by the application of the spectroscopic and impurity transport model are in agreement within the experimental errors. The presented results show that the X-ray spectroscopy of tokamak plasma is an effective tool for both high accuracy verification of atomic data and precision plasma diagnostics.
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