场致发射正交性检验在Murphy-Good图上的应用
Applying the field emission orthodoxy test to Murphy-Good plots
摘要：
在场电子发射（FE）研究中，使用适当绘制的电流-电压[I（V）]测量来检查和分析从样品实验获得的结果的质量和有效性是重要的。对于传统的绘图方法，Fowler-Nordheim（FN）图，存在所谓的“正交检验”，可以应用于FN图，以检查生成结果的FE设备/系统是否“理想”。如果不理想，则从FN图推导出的发射器表征参数可能是杂散的。最近介绍了一种新形式的FE I（V）数据图，即所谓的“墨菲-古德（MG）图”（R.G.福布斯罗伊Soc.开放科学6（2019）190912.这旨在提高从FE I（V）数据中提取特征参数值（特别是正式发射面积值）的精度。本文比较了这种新的绘图形式与旧的FN和密立根-劳里森（ML）的形式，并作出了独立的评估的一致性，其中斜率（因此规模字段）的估计可以从MG图中提取。结果表明，通过使用一个修正的公式提取的比例字段值，现有的正交检验可以适用于墨菲-古德图。发展报告的原型网络工具，可以适用于所有三种形式的有限元数据图（ML，MG和FN）的正交检验。
英文摘要：
In field electron emission (FE) studies, it is important to check and analyse the quality and validity of results experimentally obtained from samples, using suitably plotted current-voltage [I(V)] measurements. For the traditional plotting method, the Fowler-Nordheim (FN) plot, there exists a so-called "orthodoxy test" that can be applied to the FN plot, in order to check whether the FE device/system generating the results is "ideal". If it is not ideal, then emitter characterization parameters deduced from the FN plot are likely to be spurious. A new form of FE I(V) data plot, the so-called "Murphy-Good (MG) plot" has recently been introduced (R.G. Forbes, Roy. Soc. Open Sci. 6 (2019) 190912. This aims to improve the precision with which characterization-parameter values (particularly values of formal emission area) can be extracted from FE I(V) data. The present paper compares this new plotting form with the older FN and Millikan-Lauritsen (ML) forms, and makes an independent assessment of the consistency with which slope (and hence scaled-field) estimates can be extracted from a MG plot. It is shown that, by using a revised formula for the extraction of scaled-field values, the existing orthodoxy test can be applied to Murphy-Good plots. The development is reported of a prototype web tool that can apply the orthodoxy test to all three forms of FE data plot (ML, MG and FN).
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