光伏组件中光学污染建模和检测的最佳波长选择
Selection of optimal wavelengths for optical soiling modelling and detection in photovoltaic modules
摘要:
污染通过减少到达光电池的光量并通过改变其外部光谱响应来影响光伏(PV)模块性能。目前,污染监测市场正朝着测量透射率或反射率的光学传感器发展,而不是直接测量污染对光伏组件性能的影响。这些使用单一光学测量的传感器不能校正取决于太阳辐照光谱和所监测PV材料的光谱响应的污染损失。这项工作研究的方法,可以提高污染的光学检测提取完整的污染光谱配置文件使用只有两个或三个单色测量。在这项工作中,光谱透射率数据,用分光光度计测量和收集在46周的实验性污染研究在西班牙哈恩进行了分析。使用的光谱分布的半球形透射率的污染的PV玻璃被发现显着提高污染的检测,返回最低的误差独立的PV材料和辐照条件。此外,这项工作表明,它也可以选择测量波长,以尽量减少污染损失的检测误差取决于监测的光伏半导体材料(硅,CdTe,a-Si,CIGS和代表性的钙钛矿)。在这项工作中讨论的方法也被发现是更强大的潜在的测量误差相比,单波长测量技术。
英文摘要:
Soiling impacts the photovoltaic (PV) module performance by reducing the amount of light reaching the photovoltaic cells and by changing their external spectral response. Currently, the soiling monitoring market is moving toward optical sensors that measure transmittance or reflectance, rather than directly measuring the impact of soiling on the performance of photovoltaic modules. These sensors, which use a single optical measurement, are not able to correct the soiling losses that depend on the solar irradiance spectra and on the spectral response of the monitored PV material. This work investigates methods that can improve the optical detection of soiling by extracting the full soiling spectrum profiles using only two or three monochromatic measurements. Spectral transmittance data, measured with a spectrophotometer and collected during a 46-week experimental soiling study carried out in Jaén, Spain, was analysed in this work. The use of a spectral profile for the hemispherical transmittance of soiled PV glass is found to significantly improve the soiling detection, returning the lowest errors independently of the PV materials and irradiance conditions. In addition, this work shows that it is also possible to select the measurement wavelengths to minimize the soiling loss detection error depending on the monitored PV semiconductor material (silicon, CdTe, a-Si, CIGS and a representative perovskite). The approaches discussed in this work are also found to be more robust to potential measurement errors compared to single wavelength measurement techniques.
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