X射线和γ射线下静电加速锡晶须的生长
Electrostatically accelerated tin whisker development under x- and gamma-rays
摘要：
我们观察到加速锡晶须的发展下，非破坏性的γ-射线和X-射线照射，并确定的辐射剂量的特征范围为20-30 KGy，该效果变得显着。我们能够改变辐射诱导的晶须生长的电断开我们的实验装置的某些部分，从而证明了静电加速晶须发展的性质。观察到的加速因子使电离辐射成为一种潜在的非破坏性和易于实施的加速寿命测试工具。
英文摘要：
We observed the accelerated tin whisker development under non-destructive gamma-ray and x-ray irradiation and determined the characteristic range of radiation doses 20-30 KGy, for which that effect becomes significant. We were able to change the radiation induced whisker growth by electrically disconnecting some parts of our experimental setup thus demonstrating the electrostatic nature of the accelerated whisker development. The observed acceleration factors make the ionizing radiation a potential non-destructive and readily implementable accelerated life testing tool.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
