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arXiv 2005.10041math.STstat.TH
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泛函delta残差及其在基于矩的统计量的同时置信带中的应用

Functional delta residuals and applications to simultaneous confidence bands of moment based statistics

Fabian J. E. Telschow, Samuel Davenport, Armin Schwartzman

AI总结:

该研究提出泛函delta残差构造方法,证明其显式形式与乘子bootstrap fCLT,用以构建基于矩的变换泛函参数的渐近有效同时置信带,仿真验证了多类泛函统计量下的覆盖率并探讨了高斯性检验应用。

摘要:

给定某估计量的泛函中心极限定理(fCLT)和一个参数变换,我们构造了称为泛函delta残差的随机过程,其渐近具有与泛函delta方法极限过程相同的协方差结构。本文证明了针对基于矩的估计量的变换的这类残差的显式构造,以及所得泛函delta残差的乘子bootstrap fCLT。后者被用于一致估计泛函delta方法极限过程最大值的分位数,从而为变换后的泛函参数构造渐近有效的同时置信带。我们通过仿真说明了所提构造应用于Cohen's d、偏度和峰度的泛函版本时的覆盖率表现,并讨论了其在高斯性检验中的应用。

英文摘要:

Given a functional central limit (fCLT) for an estimator and a parameter transformation, we construct random processes, called functional delta residuals, which asymptotically have the same covariance structure as the limit process of the functional delta method. An explicit construction of these residuals for transformations of moment-based estimators and a multiplier bootstrap fCLT for the resulting functional delta residuals are proven. The latter is used to consistently estimate the quantiles of the maximum of the limit process of the functional delta method in order to construct asymptotically valid simultaneous confidence bands for the transformed functional parameters. Performance of the coverage rate of the developed construction, applied to functional versions of Cohen's d, skewness and kurtosis, is illustrated in simulations and their application to test Gaussianity is discussed.

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