$^{\mathbf{210}}$ Bi $β$光谱的精密测量
Precision measurement of $^{\mathbf{210}}$Bi $β$-spectrum
摘要：
用基于半导体Si（Li）探测器的谱仪对$^{210}$ Bi（历史上称为RaE）的$β-$谱形进行了精密测量。这第一禁戒非唯一跃迁的跃迁形状因子严重偏离1，了解它的光谱将在$^{210}$ Pb背景存在的低背景物理中发挥重要作用。测得的过渡形状因子可以近似为$S(W) = 1 + (-0.4363 \pm 0.0037) W + (0.0523 \pm 0.0010) W^2$，这是在良好的协议与以前的研究，并已显着提高参数精度。
英文摘要：
The precision measurement of the $β-$spectrum shape for $^{210}$Bi (historically RaE) have been performed with a spectrometer based on semiconductor Si(Li) detector. This first forbidden non-unique transition has the transition form-factor strongly deviated from unity and knowledge of its spectrum would play an important role in low-background physics in presence of $^{210}$Pb background. The measured transition form-factor could be approximated as $S(W) = 1 + (-0.4363 \pm 0.0037) W + (0.0523 \pm 0.0010) W^2$, that is in good agreement with previous studies and has significantly increased parameter precision.
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