晶体探测器侧壁刻蚀去除$^{210}$ Pb
Removal of $^{210}$Pb by Etch of Crystalline Detector Sidewalls
摘要：
许多稀有事件搜索或筛选探测器的主要背景的潜在来源是氡子体，特别是沉积在探测器表面的$^{210}$ Pb，通常在探测器制造过程中。执行后期蚀刻是具有挑战性的，因为它可能会损坏检测器。本文介绍了一种在90% C. L下用$>99\times$还原表面$^{210}$ Pb和$^{210}$ Po的后期蚀刻技术。
英文摘要：
A potential source of dominant backgrounds for many rare-event searches or screening detectors is from radon daughters, specifically $^{210}$Pb, deposited on detector surfaces, often during detector fabrication. Performing a late-stage etch is challenging because it may damage the detector. This paper describes a late-stage etching technique that reduces surface $^{210}$Pb and $^{210}$Po by $>99\times$ at 90% C.L.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
