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arXiv 2004.05260physics.ins-dethep-ex

Effect of deep gain layer and Carbon infusion on LGAD radiation hardness

R Padilla, C. Labitan, Z. Galloway, C. Gee, S. M. Mazza, F. McKinney-Martinez, H. F. -W. Sadrozinski, A. Seiden, B. Schumm, M. Wilder, Y. Zhao, H. Ren, Y. Jin, … 展开作者

R Padilla, C. Labitan, Z. Galloway, C. Gee, S. M. Mazza, F. McKinney-Martinez, H. F. -W. Sadrozinski, A. Seiden, B. Schumm, M. Wilder, Y. Zhao, H. Ren, Y. Jin, M. Lockerby, V. Cindro, G. Kramberger, I. Mandiz, M. Mikuz, M. Zavrtanik, R. Arcidiacono, N. Cartiglia, M. Ferrero, M. Mandurrino, V. Sola, A. Staiano

英文摘要:

The properties of 50 um thick Low Gain Avalanche Diode (LGAD) detectors manufactured by Hamamatsu photonics (HPK) and Fondazione Bruno Kessler (FBK) were tested before and after irradiation with 1 MeV neutrons. Their performance were measured in charge collection studies using b-particles from a 90Sr source and in capacitance-voltage scans (C-V) to determine the bias to deplete the gain layer. Carbon infusion to the gain layer of the sensors was tested by FBK in the UFSD3 production. HPK instead produced LGADs with a very thin, highly doped and deep multiplication layer. The sensors were exposed to a neutron fluence from 4e14 neq/cm2 to 4e15 neq/cm2. The collected charge and the timing resolution were measured as a function of bias voltage at -30C, furthermore the profile of the capacitance over voltage of the sensors was measured.

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