基于离散傅里叶变换和亮度分布二阶矩计算的亚微米低能径迹探测光形分析
Optical shape analysis based on discrete Fourier transform and second order moment calculation of the brightness distribution for the detection of sub-micron range low energy tracks
摘要：
为了识别记录在超细颗粒核乳胶（Nano Imaging Tracker）中的亚微米范围低能径迹，设计了一种椭圆拟合方法来分析光学显微镜拍摄的各向异性图像。在本文中，我们将报告这种新开发的方法，使用离散傅立叶变换和二阶矩分析的亮度分布。我们成功地降低了椭圆度阈值，从而提高了探测效率和角分辨率。值得注意的是，探测碳30 keV径迹的成功是世界上第一个这样的成就，其中碳30 keV离子的入射方向以41度的精度和1.7%的效率被确定。
英文摘要：
To recognize sub-micron range low energy tracks recorded in a super fine grained nuclear emulsion (Nano Imaging Tracker), an elliptical fitting method was devised to analyze anisotropic images taken by an optical microscope. In this paper, we will report on this newly developed method using discrete Fourier transform and second-order moment analysis of the brightness distribution. We succeeded in lowering the ellipticity threshold, thereby improving the detection efficiency and angular resolution. Notably, the success of detecting carbon 30 keV tracks is the first such achievement in the world, where the incident direction of carbon 30 keV ions was determined with an accuracy of 41 degree and an efficiency of 1.7%.
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