arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2003.09840cond-mat.mtrl-sci
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二氧化钒中离子液体门控诱导缺陷态的热电探针

Thermoelectric probe of defect state induced by ionic liquid gating in vanadium dioxide

Hui Xing, Peihong Zhang, Hao Zeng

摘要:

热电测量检测材料中高于和低于化学势的状态密度之间的不对称性。它提供了深入了解附近的化学势,补充电子输运测量的状态密度的微小变化。在这里,结合电阻和热电功率的测量进行二氧化钒(VO2),一个原型的相关电子材料,离子液体(IL)门控。与IL门控,低于金属到绝缘体转变(MIT)温度的电荷传输保持在热激活制度,而塞贝克系数表现出明显的过渡从半导体到金属的行为。对比的行为表明,在IL门控的电子结构的变化,由于形成的氧缺陷状态。数值模拟的基础上,结合门控诱导缺陷带的模型态密度的实验结果得到证实。这项研究揭示了热电测量是一个方便和敏感的探针的作用,诱导的缺陷状态的IL门抑制MIT在VO2,这仍然是良性的电荷传输测量,并可能为研究缺陷状态在其他材料。

英文摘要:

Thermoelectric measurements detect the asymmetry between the density of states above and below the chemical potential in a material. It provides insights into small variations in the density of states near the chemical potential, complementing electron transport measurements. Here, combined resistance and thermoelectric power measurements are performed on vanadium dioxide (VO2), a prototypical correlated electron material, under ionic-liquid (IL) gating. With IL gating, charge transport below the metal-to-insulator-transition (MIT) temperature remains in the thermally activated regime, while the Seebeck coefficient exhibits an apparent transition from semiconducting to metallic behavior. The contrasting behavior indicates changes in electronic structure upon IL gating, due to the formation of oxygen defect states. The experimental results are corroborated by numerical simulations based on a model density of states incorporating a gating induced defect band. This study reveals thermoelectric measurements to be a convenient and sensitive probe for the role of defect states induced by IL gating in suppressing the MIT in VO2, which remains benign in charge transport measurements, and possibly for studying defect sates in other materials.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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