arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2003.03244physics.app-phcond-mat.mes-hallcond-mat.mtrl-sci
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Polar Rectification Effect in Electro-Fatigued SrTiO3 Based Junctions

Xueli Xu, Hui Zhang, Zhicheng Zhong, Ranran zhang, Lihua Yin, Yuping Sun, Haoliang Huang, Yalin Lu, Yi Lu, Chun Zhou, Zongwei Ma, Lei Shen, Junsong Wang, Jiando… 展开作者

Xueli Xu, Hui Zhang, Zhicheng Zhong, Ranran zhang, Lihua Yin, Yuping Sun, Haoliang Huang, Yalin Lu, Yi Lu, Chun Zhou, Zongwei Ma, Lei Shen, Junsong Wang, Jiandong Guo, Jirong Sun, Zhigao Sheng

英文摘要:

Rectifying semiconductor junctions are crucial to electronic devices. They convert alternating current into direct one by allowing unidirectional charge flows. In analogy to the current-flow rectification for itinerary electrons, here, a polar rectification that based on the localized oxygen vacancies (OVs) in a Ti/fatigued-SrTiO3 (fSTO) Schottky junction is first demonstrated. The fSTO with OVs is produced by an electro-degradation process. The different movability of localized OVs and itinerary electrons in the fSTO yield a unidirectional electric polarization at the interface of the junction under the coaction of external and built-in electric fields. Moreover, the fSTO displays a pre-ferroelectric state located between paraelectric and ferroelectric phases. The pre-ferroelectric state has three sub-states and can be easily driven into a ferroelectric state by external electric field. These observations open up opportunities for potential polar devices and may underpin many useful polar-triggered electronic phenomena.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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