根据发射光谱的迭代分析在断路器实验中的电弧温度
Arc temperatures in a circuit breaker experiment from iterative analysis of emission spectra
摘要：
在模拟高压自能断路器的开断过程中，采用发射光谱法研究了电弧的特性。电弧在填充有SF $_6$的腔室中操作，该腔室位于由PTFE喷嘴封闭的针形郁金香形触头系统之间。腔室壁中的透明窗口和喷嘴中的狭缝使得能够在电流零点之前不到一毫秒的时间内对电弧截面进行光学研究。用成像光谱系统测量了氟原子线的侧向辐射。考虑到弧的旋转对称性，用Abel反演法确定了相应的径向发射系数。的径向温度分布计算的发射系数，包括压力测量和相应的等离子体成分。与以前的研究相比，提出了一种具体的迭代方法来考虑等离子体的光学厚度。已观察到0.2和0.4之间的最大光学厚度。针对吸收效应进行校正的温度曲线显示，随着电流向零电流降低，弧轴的最高温度不断升高。等离子体成分对绝对电弧温度的影响进行了讨论。温度分布可用于验证模型室中关断过程的CFD模拟。
英文摘要：
A switching-off process very similar to those in real high-voltage self-blast circuit-breakers is emulated in a model chamber to study the arc properties by optical emission spectroscopy. The arc is operated in a chamber filled with SF$_6$ between a pin-tulip contact system enclosed by a PTFE nozzle. Transparent windows in the chamber wall and a slit in the nozzle enable an optical investigation of the arc cross section less than one millisecond before current zero. The side-on radiance of a fluorine atom lines has been measured with an imaging spectroscopic system. Considering rotational symmetry of the arc the corresponding radial emission coefficients have been determined by Abel inversion. The radial temperature profiles are calculated from the emission coefficients including pressure measurements and the corresponding plasma composition. In contrast to previous studies, a specific iterative approach is proposed to consider the optical thickness of the plasma. A maximum optical thickness between 0.2 and 0.4 has been observed. Temperature profiles corrected for absorption effects show increasing maximum temperature in the arc axis with decreasing current towards current zero. The effect of the plasma composition on absolute arc temperatures is discussed. The temperature profiles can be used to validate CFD simulations of the switching-off process in the model chamber.
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