阻性故障限流器电流密度分布及其对器件稳定性的影响
Current density distribution in resistive fault current limiters and its effect on device stability
摘要：
提高电阻型超导限流器（R-SFCL）沿程电流均匀性是该类限流器设计中的一个重要问题。R-SFCL中电流的不均匀分布仅增加了某些超导区域中的电流，因此，在故障条件下，仅超导体的某些部分经历相变，这增加了这些区域中的热压并导致器件的击穿和破坏。在本文中，电流密度分布在常用的模式中使用的R-SFC结构进行了模拟和研究。为此，一个有效的模型，提出了R-SFCL，以实现最高的均匀性的电流和谐波相位变化的超导体相比，其他模式。在Ansys Maxwell软件中的仿真结果表明，所提出的模型具有适当的和令人满意的性能。
英文摘要：
The increase of current uniformity along of a resistive type superconductor fault current limiter (R-SFCL) in the design of this type of limiters is well perceived as an important issue. The non-uniform distribution of current in R-SFCL only increases the current in some superconducting regions, as a result, in the fault conditions, only certain parts of the superconductor undergo a phase change that increases the heat pressure in those areas and causes the breakdown and destruction of the device. In this paper, the current density distributions in common patterns used in R-SFCs constructions have been simulated and investigated. To this end, an effective model is proposed for R-SFCL to achieve the highest uniformity of current and harmonic phase change over superconductors compared to other patterns. The simulation results in the Ansys Maxwell Software advocate the appropriate and satisfying performance of the proposed model.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
