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arXiv 2003.01199cond-mat.mtrl-scicond-mat.other
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Structural and Magnetic Properties of Molecular Beam Epitaxy Grown Chromium Selenide Thin Films

Anupam Roy, Rik Dey, Tanmoy Pramanik, Amritesh Rai, Ryan Schalip, Sarmita Majumder, Samaresh Guchhait, Sanjay K Banerjee

英文摘要:

Chromium selenide thin films were grown epitaxially on Al${_2}$O${_3}$(0001) and Si(111)-(7${\times}$7) substrates using molecular beam epitaxy (MBE). Sharp streaks in reflection high-energy electron diffraction and triangular structures in scanning tunneling microscopy indicate a flat smooth film growth along the c-axis, and is very similar to that from a hexagonal surface. X-ray diffraction pattern confirms the growth along the c-axis with c-axis lattice constant of 17.39 Å. The grown film is semiconducting, having a small band gap of about 0.034 eV, as calculated from the temperature dependent resistivity. Antiferromagnetic nature of the film with a Néel temperature of about 40 K is estimated from the magnetic exchange bias measurements. A larger out-of-plane exchange bias, along with a smaller in-plane exchange bias is observed below 40 K. Exchange bias training effects are analyzed based on different models and are observed to be following a modified power-law decay behavior.

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