基于稀疏采样的原子尺度STEM-EELS图像快速重建
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling
摘要：
讨论了扫描透射电子显微镜（STEM）中部分采样光谱图像的重建，以加速采集。对于许多成像方式，文献中已广泛考虑了图像重建问题，但只有少数尝试处理3D数据，例如通过STEM电子能量损失谱（EELS）获取的光谱图像。此外，在显微镜文献中提出的方法中，有些方法快速但不准确，而另一些方法提供准确的重建，但代价是高计算负担。因此，所提出的重建方法没有一个在精度和计算复杂度方面满足我们的期望。在本文中，我们提出了一种快速，准确的重建方法适用于原子尺度的EELS。这种方法相比，流行的解决方案，如β过程因子分析（BPFA），这是第一次使用的STEM-EELS图像。将进行基于真实合成数据的实验。
英文摘要：
This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature for many imaging modalities, but only a few attempts handled 3D data such as spectral images acquired by STEM electron energy loss spectroscopy (EELS). Besides, among the methods proposed in the microscopy literature, some are fast but inaccurate while others provide accurate reconstruction but at the price of a high computation burden. Thus none of the proposed reconstruction methods fulfills our expectations in terms of accuracy and computation complexity. In this paper, we propose a fast and accurate reconstruction method suited for atomic-scale EELS. This method is compared to popular solutions such as beta process factor analysis (BPFA) which is used for the first time on STEM-EELS images. Experiments based on real as synthetic data will be conducted.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
