arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2001.06265cs.CVcs.LGeess.IV

SieveNet: A Unified Framework for Robust Image-Based Virtual Try-On

IIT Hyderabad(印度理工学院海得拉巴分校);Media and Data Science Research Lab, Adobe(奥多比媒体与数据科学研究实验室);Stanford University(斯坦福大学);IIIT Hyderbad(印度国际信息技术学院海得拉巴分校)

Surgan Jandial, Ayush Chopra, Kumar Ayush, Mayur Hemani, Abhijeet Kumar, Balaji Krishnamurthy

英文摘要:

Image-based virtual try-on for fashion has gained considerable attention recently. The task requires trying on a clothing item on a target model image. An efficient framework for this is composed of two stages: (1) warping (transforming) the try-on cloth to align with the pose and shape of the target model, and (2) a texture transfer module to seamlessly integrate the warped try-on cloth onto the target model image. Existing methods suffer from artifacts and distortions in their try-on output. In this work, we present SieveNet, a framework for robust image-based virtual try-on. Firstly, we introduce a multi-stage coarse-to-fine warping network to better model fine-grained intricacies (while transforming the try-on cloth) and train it with a novel perceptual geometric matching loss. Next, we introduce a try-on cloth conditioned segmentation mask prior to improve the texture transfer network. Finally, we also introduce a dueling triplet loss strategy for training the texture translation network which further improves the quality of the generated try-on results. We present extensive qualitative and quantitative evaluations of each component of the proposed pipeline and show significant performance improvements against the current state-of-the-art method.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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