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arXiv 1910.06239stat.MLcs.LGstat.ME
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使用深度学习的双样本测试

Two-sample Testing Using Deep Learning

Hasso Plattner Institute for Digital Engineering, University of Potsdam(波茨坦大学哈索·普拉特纳数字工程研究所);Technical University of Kaiserslautern(凯泽斯劳滕工业大学);University of Southern California(南加利福尼亚大学);Hasso Plattner Institute for Digital Health at Mount Sinai(西奈山哈索·普拉特纳数字健康研究所)

Matthias Kirchler, Shahryar Khorasani, Marius Kloft, Christoph Lippert

摘要:

我们提出了一个基于学习的深度神经网络表示的双样本测试过程。为此,我们定义了两个检验统计量,对映射到隐藏层上的数据样本执行渐近位置测试。测试是一致的,并且渐近控制1型错误率。其检验统计量可在线性时间内进行评价(在样本量内)。合适的数据表示以数据驱动的方式获得,通过在辅助(可能不同的)数据集上解决有监督或无监督的迁移学习任务。如果没有辅助数据可用,我们将数据分成两块:一块用于学习表示,另一块用于计算检验统计量。在对音频样本、自然图像和三维神经成像数据的实验中,与最先进的双样本测试(如核方法和分类器双样本测试)相比,我们的测试在类型2错误率(高达35个百分点)方面显着降低。

英文摘要:

We propose a two-sample testing procedure based on learned deep neural network representations. To this end, we define two test statistics that perform an asymptotic location test on data samples mapped onto a hidden layer. The tests are consistent and asymptotically control the type-1 error rate. Their test statistics can be evaluated in linear time (in the sample size). Suitable data representations are obtained in a data-driven way, by solving a supervised or unsupervised transfer-learning task on an auxiliary (potentially distinct) data set. If no auxiliary data is available, we split the data into two chunks: one for learning representations and one for computing the test statistic. In experiments on audio samples, natural images and three-dimensional neuroimaging data our tests yield significant decreases in type-2 error rate (up to 35 percentage points) compared to state-of-the-art two-sample tests such as kernel-methods and classifier two-sample tests.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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