非晶态含氟聚合物-电解质界面的电控局域电荷捕获
Electrically controlled localized charge trapping at amorphous fluoropolymer-electrolyte interfaces
摘要：
电荷陷阱是电润湿介质（EWOD）技术中长期存在的问题，它降低了EWOD的可靠性，限制了其实际应用。虽然对这一现象进行了宏观的研究，但微观的研究还很缺乏。本文采用局部接触角测量、电润湿（EW）探针和Kelvin探针力显微镜（KPFM）三种检测方法，证明了陷阱电荷定位在三相接触线区域。此外，我们证明了这种EW诱导的电荷捕获现象可以被用作一种简单且低成本的方法来在氟聚合物表面上沉积电荷。通过该方法，三相接触线附近的电荷密度可达0.46 mC/m2，沉积电荷的线宽范围为20 - 300 μ m。特别地，即使在用水滴在样品表面上进行12小时的苛刻测试之后，以及在用水蒸气处理3小时之后，负电荷密度也不降低。这些发现为需要稳定和可控表面电荷的应用提供了一种方法。
英文摘要：
Charge trapping is a long-standing problem in electrowetting-on-dielectric (EWOD), causing reliability reduction and restricting its practical applications. Although this phenomenon has been investigated macroscopically, the microscopic investigations are still lacking. In this work, the trapped charges are proven to be localized at three-phase contact line region by using three detecting methods -- local contact angle measurements, electrowetting (EW) probe, and Kelvin Probe Force Microscopy (KPFM). Moreover, we demonstrate that this EW-induced charge trapping phenomenon can be utilized as a simple and low-cost method to deposit charges on fluoropolymer surfaces. Charge density near the three-phase contact line up to 0.46 mC/m2 and the line width with deposited charges ranging from 20 to 300 micrometer are achieved by the proposed method. Particularly, negative charge densities do not degrade even after harsh testing with a water droplet on top of the sample surfaces for 12 hours, as well as after being treated by water vapor for 3 hours. These findings provide an approach for applications which desire stable and controllable surface charges.
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