基于极值的临界单事件失效概率估计
Extreme Value Based Estimation of Critical Single Event Failure Probability
摘要：
提出了一种新的集成电路在空间离子碰撞下的生存概率函数。与传统方法不同，该函数是基于极值统计量的，它与临界单粒子效应无关。
英文摘要：
A new survival probability function of ICs under space ion impact is proposed. Unlike the conventional approach, the function is based on the extreme value statistics which is rele-vant to the critical single event effects.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
