SiPM光串扰特性及其与保护窗厚度的关系
Characterization of SiPM Optical Crosstalk and its Dependence on the Protection-Window Thickness
摘要：
硅光电倍增器（SiPMs）由于其高的光子探测效率、紧凑的结构和低的工作电压，在医学成像、粒子物理和高能天体物理等领域得到了广泛的应用。然而，SiPM的所谓光学串扰（OCT）现象是其采用的主要缺点。在初级入射光子引起的雪崩过程之后，次级红外光子在硅衬底内部自发地发射，并且它们可以被周围的光电二极管检测到。因此，相当于多个光电子的大输出脉冲以一定的概率（OCT率）被观察到，即使对于单光子事件，也使得电荷分辨率变差，并且增加了诸如大气切伦科夫望远镜等应用中的单光子事件的意外触发率。在我们之前的研究中，我们发现单通道SiPM的OCT速率取决于其保护树脂窗口的厚度，这可以通过树脂内的光子传播来解释。在本研究中，我们测量了OCT率的多通道SiPM和光子传播引起的相邻通道。发现两种OCT率均取决于保护窗厚度。我们报告我们的OCT测量的多通道SiPM和比较与光线跟踪模拟。
英文摘要：
Owing to their high photon detection efficiency, compactness, and low operating voltage, silicon photomultipliers (SiPMs) have found widespread application in many fields, including medical imaging, particle physics, and high-energy astrophysics. However, the so-called optical crosstalk (OCT) phenomenon of SiPMs is a major drawback to their adoption. Secondary infrared photons are emitted inside the silicon substrate spontaneously after the avalanche process caused by the primary incident photons, and they can be detected by the surrounding photodiodes. As a result large output pulses that are equivalent to multiple photoelectrons are observed with a certain probability (OCT rate), even for single-photon events, making the charge resolution worse and increasing the rate of accidental triggers by single-photon events in applications such as atmospheric Cherenkov telescopes. In our previous study, we found that the OCT rates of single-channel SiPMs was dependent on the thickness of their protection resin window, which may be explained by photon propagation inside the resin. In the present study, we measured the OCT rate of a multichannel SiPM and those of neighboring channels caused by photon propagation. Both OCT rates were found to be dependent on the protection-window thickness. We report our OCT measurements of a multichannel SiPM and comparisons with a ray-tracing simulation.
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