二向色角分辨光电子能谱学中的局部Berry曲率特征
Local Berry curvature signatures in dichroic angle-resolved photoelectron spectroscopy
摘要：
拓扑非平凡的二维材料在下一代光电应用中有着巨大的潜力。然而，测量霍尔或自旋霍尔响应通常是一个挑战，并且实际上限于基态。一种以微分方式追踪拓扑特征的实验技术将提供有用的见解。在这项工作中，我们表明，圆二色角分辨光电子能谱学（ARPES）提供了一个强大的工具，可以解决的拓扑和量子几何性质的动量空间。特别是，我们研究了如何利用其密切的联系，轨道角动量映射出的签名的本地Berry曲率。自旋分辨检测的光电子允许扩展的方法自旋陈绝缘体。我们的预测得到了最先进的\emph{ab initio}模拟，采用时间相关的密度泛函理论，补充模型计算。目前的建议可以扩展到解决拓扑性质的材料在时间分辨的方式平衡。
英文摘要：
Topologically nontrivial two-dimensional materials hold great promise for next-generation optoelectronic applications. However, measuring the Hall or spin-Hall response is often a challenge and practically limited to the ground state. An experimental technique for tracing the topological character in a differential fashion would provide useful insights. In this work, we show that circular dichroism angle-resolved photoelectron spectroscopy (ARPES) provides a powerful tool which can resolve the topological and quantum-geometrical character in momentum space. In particular, we investigate how to map out the signatures of the local Berry curvature by exploiting its intimate connection to the orbital angular momentum. A spin-resolved detection of the photoelectrons allows to extend the approach to spin-Chern insulators. Our predictions are corroborated by state-of-the art \emph{ab initio} simulations employing time-dependent density functional theory, complemented with model calculations. The present proposal can be extended to address topological properties in materials out of equilibrium in a time-resolved fashion.
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