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arXiv 1902.08703physics.app-ph
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由反射系数和透射系数反演对称金属丝网表面磁化率和孔隙率的方法

Retrieval Approach for Determining Surface Susceptibilities and Surface Porosities of a Symmetric Metascreen from Reflection and Transmission Coefficients

Christopher L. Holloway, Edward F. Kuester, Abdulaziz H. Haddab

摘要:

最近,我们导出了元屏(具有“渔网”结构的元表面,即~)表面电磁场的广义片跃迁条件(GSTC)。例如,在相对不可穿透的表面中的任意间隔开的孔的周期性阵列)。这些GSTC中的参数被解释为有效的表面渗透率和表面孔隙率,它们本身与构成超筛分的孔的几何形状有关。在本文中,我们使用这些GSTC推导出的平面波反射($R$)和传输($T$)系数的对称metascreen,表示在这些表面参数。从这些方程中,我们开发了一种检索方法,用于确定唯一定义的有效表面渗透率和表面孔隙率,从测量或模拟数据的$R$和$T$系数的metascreen的特点。我们提出了检索的表面参数的元屏幕组成的五种不同类型的孔(圆孔,方孔,十字架,槽,和一个正方形的孔填充高对比度的电介质)。最后一个例子展示了有趣的共振频率,当孔径未被填充时不存在共振,这开辟了设计具有独特滤波特性的超颖表面的可能性。检索的表面参数进行了验证,通过比较他们与其他方法。

英文摘要:

Recently we derived generalized sheet transition conditions (GSTCs) for electromagnetic fields at the surface of a metascreen (a metasurface with a ``fishnet'' structure, i.~e., a periodic array of arbitrary spaced apertures in a relatively impenetrable surface). The parameters in these GSTCs are interpreted as effective surface susceptibilities and surface porosities, which themselves are related to the geometry of the apertures that constitute the metascreen. In this paper, we use these GSTCs to derive the plane-wave reflection ($R$) and transmission ($T$) coefficients of a symmetric metascreen, expressed in terms of these surface parameters. From these equations, we develop a retrieval approach for determining the uniquely defined effective surface susceptibilities and surface porosities that characterize the metascreen from measured or simulated data for the $R$ and $T$ coefficients. We present the retrieved surface parameters for metascreens composed of five different types of apertures (circular holes, square holes, crosses, slots, and a square aperture filled with a high-contrast dielectric). The last example exhibits interesting resonances at frequencies where no resonances exist when the aperture is not filled, which opens up the possibility of designing metasurfaces with unique filtering properties. The retrieved surface parameters are validated by comparing them to other approaches.

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