Near-Field Scanning Microwave Microscopy in the Single Photon Regime

Multi-tip near-field scanning thermal microscopy

A theory is presented to describe the heat-flux radiated in near-field regime by a set of interacting nanoemitters held at different temperatures in vacuum or above a solid surface. We show that this thermal energy can be focused and even amplified in spots that are much smaller than those obtained with a single thermal source. We also demonstrate the possibility to locally pump heat using specific geometrical configurations. These many body effects pave the way to a multi-tip near-field scanning thermal microscopy which could find broad applications in the fields of nanoscale thermal manageme…

利用大型语言模型和社交媒体实现扫描探针显微镜自动化

Leveraging Large Language Models and Social Media for Automation in Scanning Probe Microscopy

本研究开发了结合大型语言模型与社交媒体的自动化扫描探针显微镜系统，实现实时语言无关控制，提升可访问性和效率，推动自动驾驶实验室发展。

Predicting Scattering Scanning Near-field Optical Microscopy of Mass-produced Plasmonic Devices

Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand the waveguide-coupled plasmonic antenna in as-fabricated heat-assisted magnetic recording heads. In order validate and predict results and to extract information from experimental measurements that is physically comparable to simulations, a model was developed to translate the simulated electric field into expected near-field measurements using physical para…

Surface Structures of Epitaxial B20 FeGe(-1-1-1) Thin Films via Scanning Tunneling Microscopy

We grew 20-100 nm thick films of B20 FeGe by molecular beam epitaxy and investigated the surface structures via scanning tunneling microscopy. We observed the atomic resolution of each of the four possible chemical layers in FeGe(-1-1-1). An average hexagonal surface unit cell is observed via scanning tunneling microscopy, low energy electron diffraction, and reflection high energy electron diffraction resulting in a size of ~6.84 Å in agreement with the bulk expectation. Furthermore, the atomic resolution and registry across triple-layer step edges definitively determine the grain orientation…

图像扫描显微术的k空间解释

K-space interpretation of image-scanning-microscopy

本文通过k空间分析揭示相干图像扫描显微术等效于聚束合成孔径雷达和倾斜照明显微术，并数值证明可用单个k空间探测器实现ISM。

Membrane-based scanning force microscopy

We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is vibrating and the scanning tip is at rest. We present first topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sens…