基于机械二极管的超声原子力显微镜
Mechanical-Diode based Ultrasonic Atomic Force Microscopies
摘要：
综述了基于机械二极管的超声力显微镜技术的最新进展。详细阐述了超声力显微镜（UFM）在研究材料弹性性能方面的潜力。讨论了UFM在纳米纤维中应用的优势。介绍了机械-二极管超声摩擦力显微镜（MD-UHFM），并与横向声学力显微镜（LAFM）和扭转共振（TR）-原子力显微镜（AFM）进行了比较。MD-UFFM为研究纳米尺度下的剪切弹性、粘弹性和摩擦学性能提供了一种新的方法。在纳米接触和外差力显微镜（HFM）的实现节拍的激励进行了说明。HFM引入了一个非常有趣的过程，以利用高频驱动中固有的时间分辨率。
英文摘要：
Recent advances in mechanical-diode based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the application of UFM in nanofabrication are discussed. Mechanical-Diode Ultrasonic Friction Force Microscopy (MD-UFFM) is introduced, and compared with Lateral Acoustic Force Microscopy (LAFM) and Torsional Resonance (TR) - Atomic Force Microscopy (AFM). MD-UFFM provides a new method for the study of shear elasticity, viscoelasticity and tribological properties on the nanoscale. The excitation of beats at nanocontacs and the implementation of Heterodyne Force Microscopy (HFM) are described. HFM introduces a very interesting procedure to take advantage of the time resolution inherent in high-frequency actuation.
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