多参数动态光响应显微术用于范德华异质结构的数据密集型光电测量
Multiple Parameter Dynamic Photoresponse Microscopy for data-intensive optoelectronic measurements of van der Waals heterostructures
摘要：
由二维（2D）材料的范德华（vdW）异质结构制成的量子器件可能预示着设计材料的新前沿，其表现出新颖的电子性质和不寻常的电子相。然而，由于层状原子结构的复杂性和出现的物理特性，具有定制的物理特性的设备的实验实现将需要跨越材料和设备参数的大范围的全面测量。这种多参数测量需要新的策略，将数据密集型技术（通常应用于天文学和高能物理学）与固态物理学和材料科学的实验工具相结合。我们讨论了全面的实验科学的挑战，并提出了一种技术，称为多参数动态光响应显微镜（MPEST），利用超快激光，衍射限制扫描束流光学，和硬件自动化来表征二维异质结构的光响应在一个时间有效的方式。在VDW异质结上使用综合方法会导致大量复杂的数据集;在MPT的情况下，我们测量了大量需要高级图像分析以提取底层物理的图像。我们讨论如何处理这样的数据集一般，并在特定情况下的石墨烯-氮化硼-石墨异质结构光电池。
英文摘要：
Quantum devices made from van der Waals (vdW) heterostructures of two dimensional (2D) materials may herald a new frontier in designer materials that exhibit novel electronic properties and unusual electronic phases. However, due to the complexity of layered atomic structures and the physics that emerges, experimental realization of devices with tailored physical properties will require comprehensive measurements across a large domain of material and device parameters. Such multi-parameter measurements require new strategies that combine data-intensive techniques - often applied in astronomy and high energy physics - with the experimental tools of solid state physics and materials science. We discuss the challenges of comprehensive experimental science and present a technique, called Multi-Parameter Dynamic Photoresponse Microscopy (MPDPM), that utilizes ultrafast lasers, diffraction limited scanning beam optics, and hardware automation to characterize the photoresponse of 2D heterostructures in a time efficient manner. Using comprehensive methods on vdW heterostructures results in large and complicated data sets; in the case of MPDPM, we measure a large set of images requiring advanced image analysis to extract the underlying physics. We discuss how to approach such data sets in general, and in the specific case of a graphene - boron nitride - graphite heterostructure photocell.
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