arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1806.04728cs.CV
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RepMet: Representative-based metric learning for classification and one-shot object detection

IBM Research AI(IBM研究院人工智能部门);Tel-Aviv University(特拉维夫大学);Technion(以色列理工学院)

Leonid Karlinsky, Joseph Shtok, Sivan Harary, Eli Schwartz, Amit Aides, Rogerio Feris, Raja Giryes, Alex M. Bronstein

英文摘要:

Distance metric learning (DML) has been successfully applied to object classification, both in the standard regime of rich training data and in the few-shot scenario, where each category is represented by only a few examples. In this work, we propose a new method for DML that simultaneously learns the backbone network parameters, the embedding space, and the multi-modal distribution of each of the training categories in that space, in a single end-to-end training process. Our approach outperforms state-of-the-art methods for DML-based object classification on a variety of standard fine-grained datasets. Furthermore, we demonstrate the effectiveness of our approach on the problem of few-shot object detection, by incorporating the proposed DML architecture as a classification head into a standard object detection model. We achieve the best results on the ImageNet-LOC dataset compared to strong baselines, when only a few training examples are available. We also offer the community a new episodic benchmark based on the ImageNet dataset for the few-shot object detection task.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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