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arXiv 1804.07574cond-mat.mtrl-sci
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氧化还原反应增强\LNO{}(001)/Al界面肖特基接触

Redox reaction enhanced Schottky contact at a \LNO{}(001)/Al interface

Joseph Scola, Bruno Berini, Yves Dumont, Pavan Nukala, Brahim Dkhil

摘要:

氧化物和金属之间的界面处出现的现象可能是由于电荷转移和质量传输改变了本体性质。通过用铝涂覆金属氧化物LaNiO $_3$,我们制造了表现出类似二极管行为的结。在平衡时,界面是绝缘的。金属行为可以通过仅在一个极性中跨结施加电压降来恢复。研究了其在正、反向偏压下的电学特性。所观察到的电阻效应上升到$10^5$ \%,可以解释为(i)在界面处发生的自发氧化还原反应和(ii)在直接偏压下由电荷注入引起的反转。

英文摘要:

Emergent phenomena at interfaces between oxides and metals can appear due to charge transfer and mass transport that modify the bulk properties. By coating the metallic oxide LaNiO$_3$ by aluminium, we fabricated a junction exhibiting a diode-like behaviour. At the equilibrium, the interface is insulating. The metallic behaviour can be recovered by applying a voltage drop across the junction in one polarity only. The electrical properties in direct and reverse bias are investigated. The observed electro-resistive effect rises up to $10^5$ \% and can be interpreted in terms of (i) a spontaneous redox reaction occurring at the interface and (ii) its reversal induced by charge injection in direct bias.

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