arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1803.04964cs.LGcs.CVeess.SP

Onion-Peeling Outlier Detection in 2-D data Sets

Mississippi State University(密西西比州立大学)

Archit Harsh, John E. Ball, Pan Wei

英文摘要:

Outlier Detection is a critical and cardinal research task due its array of applications in variety of domains ranging from data mining, clustering, statistical analysis, fraud detection, network intrusion detection and diagnosis of diseases etc. Over the last few decades, distance-based outlier detection algorithms have gained significant reputation as a viable alternative to the more traditional statistical approaches due to their scalable, non-parametric and simple implementation. In this paper, we present a modified onion peeling (Convex hull) genetic algorithm to detect outliers in a Gaussian 2-D point data set. We present three different scenarios of outlier detection using a) Euclidean Distance Metric b) Standardized Euclidean Distance Metric and c) Mahalanobis Distance Metric. Finally, we analyze the performance and evaluate the results.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑