用MeV超快电子显微镜成像相对论电子束的纳米尺度空间调制
Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope
摘要：
基于加速器的MeV超快电子显微镜（MUEM）被认为是研究纳米空间尺度和皮秒时间尺度结构动力学的一种有前途的工具。在这里，我们报告的实验测试的原型MUEM高品质的图像与纳米级的精细结构记录与脉冲3兆电子伏皮秒电子束。在单激发模式下操作的MUEM的时间和空间分辨率为约4 ps（FWHM）和100 nm（FWHM），对应于4 e-19 s*m的时间-空间分辨率，比用现有技术的单激发keV UEM实现的时间-空间分辨率高约2个数量级。使用该仪器，我们提供了可视化的纳米级周期性的空间调制的电子束，这可能会被转换成纵向密度调制通过发射度交换，使生产高功率相干辐射在短波长的演示。我们的研究结果标志着朝着单次发射纳米分辨率MUEM和紧凑的强X射线源迈出了一大步，这些X射线源可能在许多科学领域中具有广泛的应用。
英文摘要：
Accelerator-based MeV ultrafast electron microscope (MUEM) has been proposed as a promising tool to study structural dynamics at the nanometer spatial scale and picosecond temporal scale. Here we report experimental tests of a prototype MUEM where high quality images with nanoscale fine structures were recorded with a pulsed 3 MeV picosecond electron beam. The temporal and spatial resolution of the MUEM operating in single-shot mode is about 4 ps (FWHM) and 100 nm (FWHM), corresponding to a temporal-spatial resolution of 4e-19 s*m, about 2 orders of magnitude higher than that achieved with state-of-the-art single-shot keV UEM. Using this instrument we offer the demonstration of visualizing the nanoscale periodic spatial modulation of an electron beam, which may be converted into longitudinal density modulation through emittance exchange to enable production of high-power coherent radiation at short wavelengths. Our results mark a great step towards single-shot nanometer-resolution MUEMs and compact intense x-ray sources that may have wide applications in many areas of science.
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