高维弹性界面的稀有缺陷钉扎和有效迁移率
Pinning by rare defects and effective mobility for elastic interfaces in high dimensions
摘要：
在弱无序介质中，高维界面是否存在退钉扎相变是有争议的。根据拉金参数和微扰展开，人们期望具有重整化迁移率$μ_{\text{eff}}$的线性响应。在本文中，我们将这些预测与完全连接模型的精确解进行了比较，该模型显示了有限的临界力$f_c$。在小的障碍，我们揭示了一个中间的线性政权的$f_c < f < 1$的特点是重整化迁移率$μ_{\text{eff}}$。我们的研究结果表明，在高维临界力总是有限的，并确定了稀有杂质的影响，是错过了微扰膨胀。然而，微扰膨胀正确地描述了一个中间制度，应该是可见的小混乱。
英文摘要：
The existence of a depinning transition for a high dimensional interface in a weakly disordered medium is controversial. Following Larkin arguments and a perturbative expansion, one expects a linear response with a renormalized mobility $μ_{\text{eff}}$ . In this paper, we compare these predictions with the exact solution of a fully connected model, which displays a finite critical force $f_c$. At small disorder, we unveil an intermediary linear regime for $f_c < f < 1$ characterized by the renormalized mobility $μ_{\text{eff}}$. Our results suggest that in high dimension the critical force is always finite and determined by the effect of rare impurities that is missed by the perturbative expansion. However, the perturbative expansion correctly describes an intermediate regime that should be visible at small disorder.
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