电荷耦合器件读出过程中相间区电荷俘获的重要性
Importance of charge capture in inter-phase regions during readout of charge-coupled devices
摘要：
目前对电荷耦合器件（CCD）中电荷转移动力学的理解是，电荷在时钟序列中从一个相位快速移动到下一个相位，并且密度低到相间区域中的电荷捕获可以忽略不计。然而，电子成像中心开发的新的模拟能力，包括电子密度模拟的直接输入，使得进一步研究这一假设成为可能。作为Euclid CCD 273器件辐射测试活动的一部分，使用阱泵浦方法获得了数据，可用于识别和消除CCD的单一缺陷。结合这些数据与模拟，我们发现，捕获过程中的相位之间的电荷转移确实是必要的，以解释的数据分析的结果。这一结果不仅会影响陷阱泵浦理论和如何进行陷阱泵浦，而且会影响如何以最佳方式读出辐射损伤的CCD。
英文摘要：
The current understanding of charge transfer dynamics in Charge-Coupled Devices (CCDs) is that charge is moved so quickly from one phase to the next in a clocking sequence and with a density so low that trapping of charge in the inter-phase regions is negligible. However, new simulation capabilities developed at the Centre for Electronic Imaging, that includes direct input of electron density simulations, has made it possible to investigate this assumption further. As part of the radiation testing campaign of the Euclid CCD273 devices, data has been obtained using the trap pumping method, that can be used to identify and characterise single defects CCDs. Combining this data with simulations, we find that trapping during the transfer of charge between phases is indeed necessary in order to explain the results of the data analysis. This result could influence not only trap pumping theory and how trap pumping should be performed, but also how a radiation damaged CCD is read out in the most optimal way.
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