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arXiv 1709.08352cond-mat.mtrl-scicond-mat.other
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利用X射线共振磁散射二向色性的对称性和振幅研究磁性多层膜的手征性

Chirality in magnetic multilayers probed by the symmetry and the amplitude of dichroism in X-ray resonant magnetic scattering

J. -Y. Chauleau, W. Legrand, N. Reyren, D. Maccariello, S. Collin, H. Popescu, K. Bouzehouane, V. Cros, N. Jaouen, A. Fert

摘要:

凝聚态物质中的手征性对于理解和掌握各种新的基本物理机制具有重要的意义,因而成为当今最重要的研究课题。因此,能够容易地揭示序参量的精确绕组的通用实验方法是必不可少的。在这里,我们报告的X射线共振磁散射(XRMS)作为一个简单的工具,直接识别手性磁性系统的属性。我们表明,它可以直接和明确地确定手征磁分布的主要特征:即它的手征性质,定量的缠绕方向(顺时针或逆时针)和它的类型(Néel/摆线或布洛赫/螺旋)。该方法与模型无关,不需要磁参数的先验知识,并且可以应用于具有范围从几纳米(波长受限)到几微米的磁畴的任何系统。通过使用基于Co的具有定制的磁手性的原型多层膜,|Pt界面的实验结果说明了该方法的有效性.

英文摘要:

Chirality in condensed matter is now a topic of the utmost importance because of its significant role in the understanding and mastering of a large variety of new fundamental physicals mechanisms. Versatile experimental approaches, capable to reveal easily the exact winding of order parameters are therefore essential. Here we report X-ray resonant magnetic scattering (XRMS) as a straightforward tool to identify directly the properties of chiral magnetic systems. We show that it can straight-forwardly and unambiguously determine the main characteristics of chiral magnetic distributions: i.e. its chiral nature, the quantitative winding sense (clockwise or counter-clockwise) and its type (Néel/cycloidal or Bloch/helical). This method is model-independent, does not require a-priori knowledge of magnetic parameters and can be applied to any system with magnetic domains ranging from few nanometers (wavelength limited) to several microns. By using prototypical multilayers with tailored magnetic chiralities based on the Co|Pt interface we illustrate the strength of this method.

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