首次使用直径为88 mm的单晶进行间接X射线成像试验
First Indirect X-Ray Imaging Tests With An 88-mm Diameter Single Crystal
摘要：
使用先进光子源（APS）的1-BM-C光束线，我们已经进行了初步的间接X射线成像点扩散函数（PSF）测试的一个独特的88毫米直径的YAG：Ce单晶的厚度只有100微米。晶体被粘合到光纤板（FOP）上，用于机械支撑，并允许选择FO耦合到大画幅相机。这种配置分辨率进行了比较，自支撑的25毫米直径的晶体，有和没有铝反射涂层。上游单色器用于从同步辐射的宽带APS偏转磁体源中选择17 keV的X射线。然后使用上游的可调Mo准直器在晶体表面提供一系列从200微米到约15-20微米（FWHM）的X射线源横向尺寸。在这种情况下，发射的闪烁体辐射与ANDOR Neo sCMOS相机透镜耦合，间接X射线图像通过基于MATLAB的图像处理程序离线处理。基于对X射线图像投影轮廓的单个高斯峰拟合，我们观察到10.5微米PSF。因此，该样品表现出优于具有约100微米PSF的相同厚度的标准P43多晶磷光体的空间分辨率。这种单晶分辨率与88 mm直径相结合，使其成为支持未来X射线衍射或晶片形貌实验的候选材料。
英文摘要：
Using the 1-BM-C beamline at the Advanced Photon Source (APS), we have performed the initial indirect x-ray imaging point-spread-function (PSF) test of a unique 88-mm diameter YAG:Ce single crystal of only 100-micron thickness. The crystal was bonded to a fiber optic plate (FOP) for mechanical support and to allow the option for FO coupling to a large format camera. This configuration resolution was compared to that of self-supported 25-mm diameter crystals, with and without an Al reflective coating. An upstream monochromator was used to select 17-keV x-rays from the broadband APS bending magnet source of synchrotron radiation. The upstream, adjustable Mo collimators were then used to provide a series of x-ray source transverse sizes from 200 microns down to about 15-20 microns (FWHM) at the crystal surface. The emitted scintillator radiation was in this case lens coupled to the ANDOR Neo sCMOS camera, and the indirect x-ray images were processed offline by a MATLAB-based image processing program. Based on single Gaussian peak fits to the x-ray image projected profiles, we observed a 10.5 micron PSF. This sample thus exhibited superior spatial resolution to standard P43 polycrystalline phosphors of the same thickness which would have about a 100-micron PSF. This single crystal resolution combined with the 88-mm diameter makes it a candidate to support future x-ray diffraction or wafer topography experiments.
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