聚合物富勒烯体异质结的电压依赖微分电导（dI/dV）成像
Voltage-Dependent Differential Conductance (dI/dV) Imaging of a Polymer:Fullerene Bulk-Heterojunction
摘要：
利用扫描隧道光谱（STS）技术研究了P3 HT：PCBM体异质结（BHJ）的微分电导（dI/dV）图像。由于材料在dI/dV图像中被能量地看到，因此成像过程提供了观察BHJ中组件的纳米域的机会。在不同电压下记录图像，以显示两种材料之间的界面区域。从载流子的观点出发，利用原始材料的态密度（DOS）谱确定了聚合物和富勒烯的能级位置，形成了具有II型排列的能量图。DOS谱记录在P3 HT：PCBM异质结另外产生的能量偏离那些组件表示弯曲的能级在界面区域。
英文摘要：
With scanning tunneling spectroscopy (STS), we probed differential conductance (dI/dV) images of P3HT:PCBM bulk-heterojunctions (BHJs). Since the materials are seen energetically in dI/dV images, the imaging process provides opportunities to view the nano-domains of the components in the BHJ. The images were recorded at different voltages to bring out the interface region between the two materials as well. The density of states (DOS) spectra of pristine materials provided location of energy levels of the polymer and the fullerene in forming energy diagram with a type-II alignment from the view-point of charge carriers. DOS spectra recorded in the P3HT:PCBM heterojunction in addition yielded energies that deviated from those of the components indicating bending of energy levels at the interface region.
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