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arXiv 1708.01484hep-phastro-ph.CO
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用低阈值表面实验探测sub-GeV质量SIMP暗物质

Probing sub-GeV mass SIMP dark matter with a low-threshold surface experiment

Jonathan H. Davis

摘要:

使用$ν$ -cleus探测器的数据,基于地球表面,我们以强相互作用大质量粒子(SIMPs)的形式对暗物质施加约束,这些粒子通过核尺度的截面与核子相互作用。对于大的SIMP-核子截面,传统的直接暗物质搜索使用地下实验的灵敏度受到SIMP经历的能量损失的限制,这是由于在它们到达探测器设备的途中与岩石覆盖层和实验屏蔽的散射。因此,基于表面的实验对于SIMP搜索是理想的,尽管由于缺乏屏蔽而导致背景大得多。我们表明,使用从最近的表面运行的低阈值低温探测器的SIMP-核子截面的值高达约$10^{-27}$厘米$^2$可以排除SIMP与质量超过100兆电子伏的数据。

英文摘要:

Using data from the $ν$-cleus detector, based on the surface of the Earth, we place constraints on dark matter in the form of Strongly Interacting Massive Particles (SIMPs) which interact with nucleons via nuclear-scale cross sections. For large SIMP-nucleon cross sections the sensitivity of traditional direct dark matter searches using underground experiments is limited by the energy loss experienced by SIMPs, due to scattering with the rock overburden and experimental shielding on their way to the detector apparatus. Hence a surface-based experiment is ideal for a SIMP search, despite the much larger background, resulting from the lack of shielding. We show using data from a recent surface run of a low-threshold cryogenic detector that values of the SIMP-nucleon cross section up to approximately $10^{-27}$ cm$^2$ can be excluded for SIMPs with masses above 100 MeV.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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