轴向弯曲非晶SiOx纳米线的均匀电子束辐照诱导非热矫直
Uniform e-beam irradiation-induced athermal straightening of axially curved amorphous SiOx nanowire
摘要：
利用透射电子显微镜在室温下原位研究了均匀电子束辐照诱导的非晶SiOx纳米线（a-SiOx NW）的再成形。结果表明，随着辐照时间的增加，轴向直的NW保持其完美的直圆柱状丝的形状，并表现出连续均匀的径向收缩。相反，轴向弯曲的NW迅速变直，并伴随着均匀的轴向收缩和均匀的径向膨胀。预计这样的研究，特别是对轴向弯曲的NW的矫直具有重要意义的纳米级处理和未来的NW为基础的结构或设备的稳定性。更重要的是，研究结果表明，传统的撞击机制和电子束加热效应是不足以解释这些过程，而我们提出的纳米曲率效应和高能束诱导的非热激活效应明显占主导地位的过程。
英文摘要：
The reshaping of amorphous SiOx nanowires (a-SiOx NWs) as purely induced by uniform electron beam (e-beam) irradiation was in-situ studied at room temperature in transmission electron microscope. It was observed that the axially straight NW kept its perfect straight cylinder-like wire shape and demonstrated a sequential uniform radial shrinkage with the increase of irradiation time. In contrast, the axially curved NW turned straight quickly accompanied with a uniform axial shrinkage and a uniform radial expansion intriguingly. It is expected that such a study especially on the straightening of axially curved NW has important implications for the nanoscale processing and stability of future NW-based structures or devices. More importantly, the findings demonstrate that the traditional knock-on mechanism and electron beam heating effect are inadequate to explain these processes while our proposed nanocurvature effect and energetic beam-induced athermal activation effect obviously dominate the processes.
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