检测已包装商品SoCs：利用老化引起的SRAM PUF不可靠性
Detecting Recycled Commodity SoCs: Exploiting Aging-Induced SRAM PUF Unreliability
摘要：
物理不可克隆功能（PUF），类似于人类指纹，已经获得了学术界和工业界的极大关注。SRAM PUF是流行的硅PUF构造之一，其利用来自SRAM单元的随机初始上电状态来提取用于识别和密钥生成应用的硬件固有秘密。SRAM PUF的优点在于它们被广泛地嵌入到商品设备中，因此这样的PUF在没有定制设计的情况下获得，并且几乎没有实现成本。一种被称为“老化”的现象改变了可以从一组SRAM PUF单元的读出中提取的响应的一致再现性-可靠性。类似于PUF如何利用不期望的制造随机性来生成硬件固有指纹，可以利用由老化引起的SRAM PUF不可靠性来检测回收的商品设备，而不需要设备的额外成本。在这种情况下，SRAM PUF本身通过利用对老化敏感的响应来充当老化传感器。我们使用SRAM中普遍部署的商业现成的微控制器进行实验验证，这补充了最近的工作证明在FPGA平台上，我们提出了一个简化的检测方法沿实验结果。我们表明，少于1,000 SRAM的响应是足够的，以保证错误接受率和错误拒绝率不超过0.001。
英文摘要：
A physical unclonable function (PUF), analogous to a human fingerprint, has gained an enormous amount of attention from both academia and industry. SRAM PUF is among one of the popular silicon PUF constructions that exploits random initial power-up states from SRAM cells to extract hardware intrinsic secrets for identification and key generation applications. The advantage of SRAM PUFs is that they are widely embedded into commodity devices, thus such a PUF is obtained without a custom design and virtually free of implementation costs. A phenomenon known as `aging' alters the consistent reproducibility---reliability---of responses that can be extracted from a readout of a set of SRAM PUF cells. Similar to how a PUF exploits undesirable manufacturing randomness for generating a hardware intrinsic fingerprint, SRAM PUF unreliability induced by aging can be exploited to detect recycled commodity devices requiring no additional cost to the device. In this context, the SRAM PUF itself acts as an aging sensor by exploiting responses sensitive to aging. We use SRAMs available in pervasively deployed commercial off-the-shelf micro-controllers for experimental validations, which complements recent work demonstrated in FPGA platforms, and we present a simplified detection methodology along experimental results. We show that less than 1,000 SRAM responses are adequate to guarantee that both false acceptance rate and false rejection rate are no more than 0.001.
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